Group Number 140X
Device Keyboard
This group covers system information gathering and testing of keyboards.
The Keyboard Zone and Map Tests offer different processes for testing the Keyboards connected to your system. It is not necessary to run both tests for full coverage. Therefore it is recommended to only run the test configured in the way you find most appropriate for your process.
To create a Zone test configuration it is recommended to create a copy of the 104 key configuration and remove any unwanted keys from the file using a text file editor.
Please contact Eurosoft if additional keyboard layouts are required for the Map test.
Test Number 301
Test Name Keyboard Zone
The Keyboard Zone Test is designed to test the different key zones that make up the internals of keyboards, allowing a basic functional test with minimal key presses. This test has two modes of use to cover the ways a keyboard can be tested.
The keyboard can be tested in Ordered mode, where key presses are expected in the order defined in the configuration file and each key press checked for contact bounce or additional key presses. This mode of operation is best suited for checking key zones on laptop keyboards.
The other mode of operation is Unordered mode where keys can be pressed in any order. Each key in the configuration file will need to be pressed, with additional key presses ignored. Once all the keys have been pressed the test passes. This mode of operation is best suited for mechanical keyboards with a larger configuration file.
Estimated Test Time Dependent on user input.
PARAM1:Test Configuration
The internal configuration file to use for the test. This file is created using the Advanced Window if the key-count parameter is not set. If the key-count is set then this parameter should be set to one of the Auto-fill identifiers listed on the Advanced Window.
PARAM2: Contact Bounce Time
The contact bounce time in Ms between each key check. A value greater than 0 will run the test in Ordered mode and a value of 0 will run in Unordered mode.
PARAM3: Time-out
The time-out between key presses before the test will fail. If set to 0 then a fail button will be shown.
ERRORCODES & TROUBLESHOOTING
Unable to load any keys to test. CODE="0x00/3FF" TROUBLESHOOTING0: The specified Key configuration file was not successfully loaded. Check that the file is present and contains keys to be tested.
Unable to load the test configuration file. CODE="0x01/3FF" TROUBLESHOOTING0: The specified Key configuration file was not successfully loaded. Check that the file is present and contains keys to be tested.
Unable to get the keyboard. CODE="0x02/001" TROUBLESHOOTING1: The test failed to start. This is most likely caused by a hardware or OS fault.
Unable to create test window. CODE="0x03/001" TROUBLESHOOTING1: The test failed to start. This is most likely caused by a hardware or OS fault.
The Operator chose to fail the test. CODE="0x04/3FF" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error.
The wrong key press was detected. CODE="0x05/011" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error.
Another key was detected during the contact bounce time. CODE="0x06/011" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error.
The test timed out. CODE="0x07/3FF" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error.
The keyboard configuration is invalid. CODE="0x08/3FF" TROUBLESHOOTING1: The test failed to start. This is most likely caused by a hardware or OS fault.
The keyboard can not be un-docked. CODE="0x09/3FF" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error.
A key press or held key was detected CODE="0x0A/011" TROUBLESHOOTING2: The test failed due to a possible fault with the hardware or due to operator error. | 
